CVE-2024-53017
Medium
Description
Memory corruption while handling test pattern generator IOCTL command.
SeverityMedium
CVSS6.6
Exploit probability—
Product
Qualcomm Sdm429w Firmware
PublishedJun 3, 2025
First seenJun 3, 2025
Weakness typeCWE-823CWE-823
How to fix
Sources list no fixed version or patch link for this vulnerability.
Affected products
| Product | Affected versions | Fixed in |
|---|---|---|
| qualcomm sdm429w_firmware | No range specified | — |
| qualcomm snapdragon_429_mobile_platform_firmware | No range specified | — |
| qualcomm wcn3620_firmware | No range specified | — |
| qualcomm wcn3660b_firmware | No range specified | — |
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